SEMINAR 2025
The Soft X-ray Beamline at the Australian Synchrotron: Capabilities, research and future directions
| Speaker | Anton Tadich, ANSTO, Australia |
| Date/Time | Tuesday, 8 Jul, 11am |
| Location | S11-02-05 Resource Room |
| Host | Prof Mark Breese |
Abstract
As one of the first beamlines built for the Australian Synchrotron, the Soft X-ray spectroscopy (SXR) beamline has been delivering photons for over 18 years to a diverse user community. Featuring a wide photon energy range (82 – 2500 eV) and full polarisation control of the x-rays from an APPLEII elliptically polarised undulator source, the SXR beamline offers experimental stations capable of performing Angle-Resolved Photoelectron Spectroscopy (ARPES), X-ray Photoelectron Spectroscopy (XPS) and Near Edge X-ray Absorption Fine Structure (NEXAFS). All three techniques are supported by a wide range of sample preparation tools and offline characterisation methods. In this presentation, an overview of the beamline capabilities and key experimental systems will be given. Recent research from the user community will be highlighted to illustrate the breadth of application of SXR techniques, and some plans for major capability upgrades will be detailed. Finally, advice for beamtime proposals will be presented to assist new users to develop competitive applications for beamtime.
Biography
Dr Anton Tadich received his PhD from La Trobe University (Victoria, Australia) in 2008, working in the photoemission instrumentation group led by Professors John Riley and Robert Leckey, both of whom pioneered the technique of Angle Resolved Photoelectron Spectroscopy (ARPES) in Australia. Following his PhD, Dr Tadich obtained a position as a beamline scientist at the Soft X-ray Beamline, Australian Synchrotron. Alongside his beamline colleagues, Dr Tadich is responsible for the training and management of visiting scientists at the beamline, as well as the maintenance and development of beamline instrumentation and techniques. He has significant expertise in synchrotron-based photoelectron spectroscopy, vacuum instrumentation and surface science techniques, and is an expert in the application of these tools to investigate the chemical and electronic structure of low dimensional condensed matter systems such as surface-transfer doped diamond, 2D materials, transition metal dichalcogenides (TMDs) and topological insulators/semimetals. Anton is a national expert in the technique of Angle Resolved Photoelectron Spectroscopy (ARPES) for measuring electronic bandstructure, and he is responsible for managing the only ARPES detector in Australia, a toroidal electron spectrometer, based at the Soft X-ray Beamline.