SSL Seminar Series 2002 No.3

Title: Nanoscale chemical characterization using TOF-SIMS and Laser SNMS
Speaker: Mr Liu Rong (SSL, Dept. of Physics, NUS)
Feburary 28, 2002
Time: 5:00-6:00pm
Physics Resource Room (Blk S13 # 02-16)

For many applications detailed information on the chemical surface composition with extremely high spatial resolution is essential. Atomic Force Microscopy offers highest spatial resolution but does not provide chemical information. However, the combination with TOF-SIMS and Laser-SNMS, the most sensitive techniques for chemical surface mapping with good lateral resolution, allows to determine the surface chemistry of nanostructures. In addition, the Focused ion beam (FIB) with a quadrupole SIMS and Nano-50 SIMS will be introduced.