Location: S13-01-02
Scanner range: 90 μm by 6μm (z-axis). Uses a very sharp cantilever tip to map the surface of relatively smooth flat surfaces.
For more information and queries, please contact:
Prof SOW Chorng Haur
Ong Pang Ming
Location: S13-01-05
Target - Cu: for powders & thin materials
For more information and queries, please contact:
Prof SOW Chorng Haur
Dicky Seah
Location: S12-03-05
Plasma Enhanced Chemical Vapour Deposition on Silicon Wafer or Glass (Quartz) slide.
For more information and queries, please contact:
Prof SOW Chorng Haur
Chen Gin Seng
Location: S12-03-05
Thin film deposition by technique of sputtering.
For more information and queries, please contact:
Prof SOW Chorng Haur
Chen Gin Seng
Location: S7
Gamma Chamber 4000A - intensity 30 krad/hr: irradiate samples with gamma rays
For more information and queries, please contact:
Choo Theam Fook
Location: S12-02-7
For absorbance & transmittance measurements; Spectral range 200-1100 nm; Resolution <2 nm
For more information and queries, please contact:
Prof SOW Chorng Haur
Location: S13-01-03
0.5 to 30KV; Magnification: 25X up to 650KX; Resolution: 1.0nm
For more information and queries, please contact:
Prof SOW Chorng Haur
Ho Kok Wen
Location: S13-01-08
The SIMS is Cameca IMS 6F equipped with a magnetic sector analyser which has resolution power of at least 25,000 M/deltaM. The system has duoplasmatron source of O2+ and O- ions and microbeam source of Cs+ ions.
For more information and queries, please contact:
A/P TOK Eng Soon
Ng Tong Hoe
Wong How Kwong
Location: S12-01-10
Raman microscopy e.g. photo luminescence.
For more information and queries, please contact:
Prof SOW Chorng Haur
Kang Nguang Heng
Location: S12-01-06
This VSM is capable of measuring magnetic moment from 700 K down to 77 K and it includes vector option for magnetic anisotropy measurement.
For more information and queries, please contact:
A/P MAHENDIRAN, Ramanathan
Ong Pang Ming