Common Facilities
Atomic Force Microscope - Dimension 3000
Location: S13-01-02
Scanner range: 90 μm by 6μm (z-axis). Uses a very sharp cantilever tip to map the surface of relatively smooth flat surfaces.
For more information and queries, please contact:
Prof SOW Chorng Haur
- Email: physowch@nus.edu.sg
- Office: S12-02-19
- Tel:+65 6516 2957
Ong Pang Ming
- Email: phyongpm@nus.edu.sg
- Office: Physics E Lab, S11-03-02
- Tel: +65 6516 2632
X-Ray Diffractometer - Philips
Location: S13-01-05
Target - Cu: for powders & thin materials
For more information and queries, please contact:
Prof SOW Chorng Haur
- Email: physowch@nus.edu.sg
- Office: S12-02-19
- Tel:+65 6516 2957
Dicky Seah
- Email: physch@nus.edu.sg
- Office: Level 3 Lab, S13-04-14
- Tel: +65 6516 2638
PECVD System
Location: S12-03-05
Plasma Enhanced Chemical Vapour Deposition on Silicon Wafer or Glass (Quartz) slide.
For more information and queries, please contact:
Prof SOW Chorng Haur
- Email: physowch@nus.edu.sg
- Office: S12-02-19
- Tel:+65 6516 2957
Chen Gin Seng
- Email: phycgs@nus.edu.sg
- Office: S13-04-16
- Tel: +65 6516 2627
RF Sputtering Machine
Location: S12-03-05
Thin film deposition by technique of sputtering.
For more information and queries, please contact:
Prof SOW Chorng Haur
- Email: physowch@nus.edu.sg
- Office: S12-02-19
- Tel:+65 6516 2957
Chen Gin Seng
- Email: phycgs@nus.edu.sg
- Office: S13-04-16
- Tel: +65 6516 2627
Gamma Irradiator
Location: S7
Gamma Chamber 4000A - intensity 30 krad/hr: irradiate samples with gamma rays
For more information and queries, please contact:
Choo Theam Fook
- Email: phyctf@nus.edu.sg
- Office: CIBA, S7-01-01
- Tel: +65 6516 2998
UV-NIR Spectrophotometer
Location: S12-02-7
For absorbance & transmittance measurements; Spectral range 200-1100 nm; Resolution <2 nm
For more information and queries, please contact:
Prof SOW Chorng Haur
- Email: physowch@nus.edu.sg
- Office: S12-02-19
- Tel:+65 6516 2957
Field Emission Scanning Electron Microscope - JEOL JSM6700F
Location: S13-01-03
0.5 to 30KV; Magnification: 25X up to 650KX; Resolution: 1.0nm
For more information and queries, please contact:
Prof SOW Chorng Haur
- Email: physowch@nus.edu.sg
- Office: S12-02-19
- Tel:+65 6516 2957
Ho Kok Wen
- Email: phyhokw@nus.edu.sg
- Office: SSLS, S13-M-09
- Tel: +65 6516 4454
SIMS - Secondary Ion Mass Spectrophotometry
Location: S13-01-08
The SIMS is Cameca IMS 6F equipped with a magnetic sector analyser which has resolution power of at least 25,000 M/deltaM. The system has duoplasmatron source of O2+ and O- ions and microbeam source of Cs+ ions.
For more information and queries, please contact:
A/P TOK Eng Soon
- Email: phytokes@nus.edu.sg
- Office: S13-03-06
- Tel: +65 6516 1192
Ng Tong Hoe
- Email: phyngth@nus.edu.sg
- Office: Physics E Lab, S11-03-02
- Tel: +65 6516 2632
Wong How Kwong
- Email: phywhk@nus.edu.sg
- Office: SSL, 13-01-08
- Tel: +65 6516 2999
Renishaw inVia Raman Microscope
Location: S12-01-10
Raman microscopy e.g. photo luminescence.
For more information and queries, please contact:
Prof SOW Chorng Haur
- Email: physowch@nus.edu.sg
- Office: S12-02-19
- Tel:+65 6516 2957
Kang Nguang Heng
- Email: phyknh@nus.edu.sg
- Office: Level 2 Lab, S11-04-01
- Tel: +65 6516 2634
VSM - Vibrating Sample Magnetometer, Lakeshore model 7404
Location: S12-01-06
This VSM is capable of measuring magnetic moment from 700 K down to 77 K and it includes vector option for magnetic anisotropy measurement.
For more information and queries, please contact:
A/P MAHENDIRAN, Ramanathan
- Email: phyrm@nus.edu.sg
- Office: S12-02-10
- Tel: +65 6516 2616
Ong Pang Ming
- Email: phyongpm@nus.edu.sg
- Office: Physics E Lab, S11-03-02
- Tel: +65 6516 2632
