Common Facilities

Atomic Force Microscope - Dimension 3000

Location: S13-01-02

Scanner range: 90 μm by 6μm (z-axis). Uses a very sharp cantilever tip to map the surface of relatively smooth flat surfaces.

For more information and queries, please contact:

Prof SOW Chorng Haur

  • Email: physowch@nus.edu.sg
  • Office: S12-02-19
  • Tel:+65 6516 2957

Ng Soo Ngo

  • Email: phyngsn@nus.edu.sg
  • Office: Level 3 Lab, S13-03-14
  • Tel:+65 6516 2823

Ong Pang Ming

  • Email: phyongpm@nus.edu.sg
  • Office: Physics E Lab, S11-03-02
  • Tel: +65 6516 2632

X-Ray Diffractometer - Philips

Location: S13-01-05

Target - Cu: for powders & thin materials

For more information and queries, please contact:

Prof SOW Chorng Haur

  • Email: physowch@nus.edu.sg
  • Office: S12-02-19
  • Tel:+65 6516 2957

Tan Teng Jar

  • Email: phytantj@nus.edu.sg
  • Office: Level 1 Lab, S12-04-02
  • Tel: +65 6516 2630

Quintel Q-2001 CT Mask Aligner

Location: S12-04-11

Process of etching, development of certain photolithographic components into interconnection patterns.

For more information and queries, please contact:

Lim Geok Quee

  • Email: phylimgq@nus.edu.sg
  • Office: Physics E Lab, S11-03-02
  • Tel: +65 6516 2632

PECVD System

Location: S12-03-05

Plasma Enhanced Chemical Vapour Deposition on Silicon Wafer or Glass (Quartz) slide.

For more information and queries, please contact:

Prof SOW Chorng Haur

  • Email: physowch@nus.edu.sg
  • Office: S12-02-19
  • Tel:+65 6516 2957

Chen Gin Seng

  • Email: phycgs@nus.edu.sg
  • Office: Level 3 Lab, S13-03-14
  • Tel: +65 6516 2823

RF Sputtering Machine

Location: S12-03-05

Thin film deposition by technique of sputtering.

For more information and queries, please contact:

Prof SOW Chorng Haur

  • Email: physowch@nus.edu.sg
  • Office: S12-02-19
  • Tel:+65 6516 2957

Chen Gin Seng

  • Email: phycgs@nus.edu.sg
  • Office: Level 3 Lab, S13-03-14
  • Tel: +65 6516 2823

Gamma Irradiator

Location: S7

Gamma Chamber 4000A - intensity 30 krad/hr: irradiate samples with gamma rays

For more information and queries, please contact:

Choo Theam Fook

  • Email: phyctf@nus.edu.sg
  • Office: CIBA, S7-01-01
  • Tel: +65 6516 2998

X-Ray Fluorescence

Location: S11-02-10A

Qualitative & quantitative analysis of inorganic materials using energy dispersive technique.

For more information and queries, please contact:

Ng Tong Hoe

  • Email: phyngth@nus.edu.sg
  • Office: Physics E Lab, S11-03-02
  • Tel: +65 6516 2632

UV-NIR Spectrophotometer

Location: S12-02-7

For absorbance & transmittance measurements; Spectral range 200-1100 nm; Resolution <2 nm

For more information and queries, please contact:

Prof SOW Chorng Haur

  • Email: physowch@nus.edu.sg
  • Office: S12-02-19
  • Tel:+65 6516 2957

Field Emission Scanning Electron Microscope - JEOL JSM6700F

Location: S13-01-03

0.5 to 30KV; Magnification: 25X up to 650KX; Resolution: 1.0nm

For more information and queries, please contact:

Prof SOW Chorng Haur

  • Email: physowch@nus.edu.sg
  • Office: S12-02-19
  • Tel:+65 6516 2957

Ho Kok Wen

  • Email: phyhokw@nus.edu.sg
  • Office: SSLS, S13-M-09
  • Tel: +65 6516 4454

SIMS - Secondary Ion Mass Spectrophotometry

Location: S13-01-08

The SIMS is Cameca IMS 6F equipped with a magnetic sector analyser which has resolution power of at least 25,000 M/deltaM. The system has duoplasmatron source of O2+ and O- ions and microbeam source of Cs+ ions.

For more information and queries, please contact:

A/P TOK Eng Soon

  • Email: phytokes@nus.edu.sg
  • Office: S13-03-06
  • Tel: +65 6516 1192

Ng Tong Hoe

  • Email: phyngth@nus.edu.sg
  • Office: Physics E Lab, S11-03-02
  • Tel: +65 6516 2632

Wong How Kwong

  • Email: phywhk@nus.edu.sg
  • Office: SSL, 13-01-08
  • Tel: +65 6516 2999

Renishaw inVia Raman Microscope

Location: S12-01-10

Raman microscopy e.g. photo luminescence.

For more information and queries, please contact:

Prof SOW Chorng Haur

  • Email: physowch@nus.edu.sg
  • Office: S12-02-19
  • Tel:+65 6516 2957

Kang Nguang Heng

  • Email: phyknh@nus.edu.sg
  • Office: Level 2 Lab, S11-04-01
  • Tel: +65 6516 2634

VSM - Vibrating Sample Magnetometer, Lakeshore model 7404

Location: S7-04-SEM

This VSM is capable of measuring magnetic moment from 700 K down to 77 K and it includes vector option for magnetic anisotropy measurement.

For more information and queries, please contact:

A/P MAHENDIRAN, Ramanathan

  • Email: phyrm@nus.edu.sg
  • Office: S12-02-10
  • Tel: +65 6516 2616

Ong Pang Ming

  • Email: phyongpm@nus.edu.sg
  • Office: Physics E Lab, S11-03-02
  • Tel: +65 6516 2632

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